Gretag Macbeth Spectrolino Spectrophotometer (X-rite, BYK)

Description

The Spectrolino® is a handheld spectrometer which measures from 380 to 730 nm, inclusive. Spectral data is reported at 10 nm intervals. It is accompanied by a kit of accessories which include a CRT attachment, a spot metering tool, and filters for polarization, D65, and a null filter. An optional UV Cut filter is also available. It uses a tungsten-halogen bulb for illuminating reflective specimens. This instrument is connected to a host computer with an RS-232 serial connection.
Filters
Spectrometer filters allow the adaption of the Spectrolino for a variety of measuring situations. The Null filter is used for most reflective and emissive measurements. The D65 filter changes the spectral output of the tungsten-halogen to more closely match that of CIE Illuminant D65. The UV Cut filter is used to remove the small amount of ultraviolet light present in the tungsten-halogen illumination so that papers with fluorescent whitening agents will not have these agents effecting the spectral measurements.
TechnicalSpecifications 6.1
SpectrolinoSpectral analysis:with a holographic diffraction grating
Spectral range:380 nm to 730 nm
Physical resolution: 10 nm
Measurement modes:Reflection, Emission, Transmission
Reflection:Measurement geometry:45°/0° ring optic DIN 5033
Measurement aperture: 4.5/8 mm
Light source: gas filled tungsten, type Aillumination
Physical filters:D65 (approximated daylight), Pol (polarised)and No (neutral, incandescent lamp light A)
Spectra: reflection, densityColorimetry:CIE-XYZ, CIE-xyY, CIE-L*a*b*, CIE-L*C*h*(a*b*), CIE-L*u*v*, CIE-L*C*h*(u*v*),LABmg, LCHmg, HunterLab, RxRyRzIllumination types:D50, D65, A, C, D30... D300, F1...F126
Technical Specifications (subject to changes)Standard observer angles:2°, 10°White base: absolute, relative
Density standards:DIN 16536, DIN 16536 NB, ANSI STATUS A,ANSI STATUS T
Measurement time:No Filter ca. 1 s, Pol Filter ca. 2.5 s,D65 ca. 2 s Filter
Measurement range:Density DIN 16536: 0.0 D – 2.5 D
Reflection:380 – 480, 650 – 730 nm:  0...200 %480 – 520, 600 – 650 nm:  0...150 %520 – 600 nm:0...120 %
Inter-instrument agreement:typically 0.3 ∆E*CIELab (D50, 2°), averagebased on 12 BCRA tiles, maximally 0.8∆E*CIELab (D50, 2°)  on 12 BCRA tiles.
Short-term repeatability:0.03 ∆E*10 CIELab (D50, 2°), mean value of10 measurements every 10 s on White.
Density repeatability:density DIN 16536 (repeatability ± 0.01 D)With No-Filter: 0.0 D – 2.2 D, Yellow 0.0 D – 1.8  Pol-Filter: 0.0 D – 2.2 D, Yellow 0.0 D – 1.5 D